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Proximity effect in planar superconducting tunnel junctions containing Nb∕NiCu superconductor/ferromagnet bilayers

G. P. Pepe, R. Latempa, L. Parlato, A. Ruotolo, G. Ausanio, G. Peluso, A. Barone, A. A. Golubov, Ya. V. Fominov, M. Yu. Kupriyanov

DOI 10.1103/PhysRevB.73.054506 · Physical Review B

T1

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Abstract

We present experimental results concerning both the fabrication and characterization of superconducting tunnel junctions containing superconductor/ferromagnet (S/F) bilayers made by niobium (S) and a weak ferromagnetic Ni0.50Cu0.50 alloy. Josephson junctions have been characterized down to T=1.4K in terms of current-voltage I-V characteristics and Josephson critical current versus magnetic field. By means of a numerical deconvolution of the I-V data the electronic density of states on both sides of the S/F bilayer has been evaluated at low temperatures. Results have been compared with theoretical predictions from a proximity model for S/F bilayers in the dirty limit in the framework of Usadel equations for the S and F layers, respectively. The main physical parameters characterizing the proximity effect in the Nb∕NiCu bilayer, such as the coherence length and the exchange field energy of the F metal, and the S/F interface parameters have been also estimated.

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FormulaReported Tc (K)Pressure (GPa)Type
Nb

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—Pressure not reportedunknown

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