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Penetration depth study of very thin superconducting Nb films

Thomas R. Lemberger, Iulian Hetel, Jacob W. Knepper, F. Y. Yang

DOI 10.1103/PhysRevB.76.094515 · Physical Review B

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Abstract

Using a low-frequency two-coil technique, we measure the magnetic penetration depth λ(T) of superconducting Nb films with thicknesses 20Å⩽d⩽228Å sputtered onto oxidized Si substrates. We find a phenomenological dependence of Tc on d, Tc∕8.5K≈tanh(d∕70Å) for films thinner than 250Å. λ−2(T)∕λ−2(0) is well fitted by weak-coupling dirty-limit theory with a weak-coupling gap, Δ(0)=1.8kBTc. λ−2(0) agrees with dirty-limit theory, given the experimental values of transition temperature Tc and residual resistivity ρ0. These results indicate that the suppression of Tc is due to mechanisms that weaken the effective pairing interaction and not due to pair breaking interactions.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
Nb

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2.14Pressure not reportedmidpoint
Nb

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2.57Pressure not reportedmidpoint
Nb

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3.9Pressure not reportedmidpoint
Nb

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5.5Pressure not reportedmidpoint
Nb

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6.8Pressure not reportedmidpoint
Nb

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7.7Pressure not reportedmidpoint
Nb

Archive — visibility unverified

Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

8.17Pressure not reportedmidpoint
Nb

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8.45Pressure not reportedmidpoint
Nb

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9.288Pressure not reportedunknown

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