Analysis of surface-bulk screening competition in the electron-doped Nd2−xCexCuO4 cuprate using x-ray photoemission spectroscopy
G. Panaccione, F. Offi, P. Torelli, G. Vanko, O. Tjernberg, P. Lacovig, A. Guarino, A. Fondacaro, A. Nigro, M. Sacchi, N. B. Brookes, G. Monaco
DOI 10.1103/PhysRevB.77.125133 · Physical Review B
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Abstract
We report core level and valence band photoemission results obtained for Nd2−xCexCuO4 (x=0.15) single crystals and films by using both soft and hard x rays, hence, with tunable depth sensitivity. When using hard x rays only, we observe distinct and energy separated structures in the main 2p53d9L peak of Cu 2p3/2 and 2p1/2 core levels, including the well screened features located at the high kinetic energy side, which were recently reported by Taguchi et al. [Phys. Rev. Lett. 95, 177002 (2005)]. By varying the photoelectron takeoff angle, we analyze the difference in the screening properties between surface and bulk, and we demonstrate the depth dependence of the electronic properties by following the evolution of the bulk-related peak. The possible influence of the surface conditions on the Cu 2p spectral features is also discussed.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Nd1.85Ce0.15CuO4 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 21 | Pressure not reported | unknown |
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