Characterization of an entangled system of two superconducting qubits using a multiplexed capacitance measurement
M. D. Shaw, J. F. Schneiderman, J. Bueno, B. S. Palmer, P. Delsing, P. M. Echternach
DOI 10.1103/PhysRevB.79.014516 · Physical Review B
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Abstract
We characterize a pair of Cooper-pair boxes coupled with a fixed capacitor using spectroscopy and measurements of the ground-state quantum capacitance. We use the extracted parameters to estimate the concurrence or degree of entanglement between the two qubits. We also present a thorough demonstration of a multiplexed quantum capacitance measurement technique, which is in principle scalable to a large array of superconducting qubits.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Al Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 0.45 | Pressure not reported | unknown |
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