Effect of current injection into thin-film Josephson junctions
V. G. Kogan, R. G. Mints
DOI 10.1103/PhysRevB.90.184504 · Physical Review B
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Abstract
New thin-film Josephson junctions have recently been tested in which the current injected into one of the junction banks governs Josephson phenomena. One thus can continuously manage the phase distribution at the junction by changing the injected current. A method of calculating the distribution of injected currents is proposed for a half-infinite thin-film strip with source-sink points at arbitrary positions at the film edges. The strip width W is assumed small relative to Λ=2λ2/d;λ is the bulk London penetration depth of the film material and d is the film thickness.
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