← Back to search

Current-induced depairing in the Bi2Te3/FeTe interfacial superconductor

M. N. Kunchur, C. L. Dean, N. Shayesteh Moghadam, J. M. Knight, Q. L. He, H. Liu, J. Wang, R. Lortz, I. K. Sou, A. Gurevich

DOI 10.1103/PhysRevB.92.094502 · Physical Review B

T1

Active bibliographic source — not scientific approval

Bibliographic access preserves source history; it does not approve extracted materials or validate reported claims. Review warnings on each occurrence separately.

Abstract

We investigated current induced depairing in the Bi2Te3/FeTe topological insulator-chalcogenide interface superconductor. The measured depairing current density provides information on the magnetic penetration depth and superfluid density, which in turn shed light on the nature of the normal state that underlies the interfacial superconductivity.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
Bi2Te3/FeTe

Archive — visibility unverified

Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

11.7Pressure not reportedonset

Similar papers