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Superconducting fluctuations and characteristic time scales in amorphous WSi

Xiaofu Zhang, Adriana E. Lita, Mariia Sidorova, Varun B. Verma, Qiang Wang, Sae Woo Nam, Alexei Semenov, Andreas Schilling

DOI 10.1103/PhysRevB.97.174502 · Physical Review B

T1

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Abstract

We study magnitudes and temperature dependencies of the electron-electron and electron-phonon interaction times which play the dominant role in the formation and relaxation of photon-induced hotspots in two-dimensional amorphous WSi films. The time constants are obtained through magnetoconductance measurements in a perpendicular magnetic field in the superconducting fluctuation regime and through time-resolved photoresponse to optical pulses. The excess magnetoconductivity is interpreted in terms of the weak-localization effect and superconducting fluctuations. Aslamazov-Larkin and Maki-Thompson superconducting fluctuations alone fail to reproduce the magnetic field dependence in the relatively high magnetic field range when the temperature is rather close to Tc because the suppression of the electronic density of states due to the formation of short-lifetime Cooper pairs needs to be considered. The time scale τi of inelastic scattering is ascribed to a combination of electron-electron (τe−e) and electron-phonon (τe−ph) interaction times, and a characteristic electron-fluctuation time (τe−fl), which makes it possible to extract their magnitudes and temperature dependencies from the measured τi. The ratio of phonon-electron (τph−e) and electron-phonon interaction times is obtained via measurements of the optical photoresponse of WSi microbridges. Relatively large τe−ph/τph−e and τe−ph/τe−e ratios ensure that in WSi the photon energy is more efficiently confined in the electron subsystem than in other materials commonly used in the technology of superconducting nanowire single-photon detectors (SNSPDs). We discuss the impact of interaction times on the hotspot dynamics and compare relevant metrics of SNSPDs from different materials.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
WSi

Archive — visibility unverified

Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

3.9Pressure not reportedunknown
WSi

Archive — visibility unverified

Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

3.44Pressure not reportedunknown

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