Josephson junction with variable thickness of the dielectric layer
T. Dobrowolski, A. Jarmoliński
DOI 10.1103/PhysRevE.101.052215 · Physical Review E
Active bibliographic source — not scientific approval
Bibliographic access preserves source history; it does not approve extracted materials or validate reported claims. Review warnings on each occurrence separately.
Abstract
The dynamics of the fluxon in the Josephson junction is studied. The dielectric layer of the junction has a variable thickness. It is shown that the modified area of the junction acts on the fluxon as a potential barrier. The relation between the critical bias current and the thickness of the dielectric layer is analytically and numerically determined.
Similar papers
Coherence effects in double-barrier Josephson junctions
similarity 0.89A. Brinkman & A. A. Golubov
Source status unknown — claims are unverified
Josephson junctions with periodic defects: Ic(H) characteristics
similarity 0.88N. Lazarides
Source status unknown — claims are unverified
Microscopic Model of Critical Current Noise in Josephson Junctions
similarity 0.88Magdalena Constantin & Clare C. Yu
Source status unknown — claims are unverified
Microscopic theory of the dc Josephson effect in clean superconductor/insulator and superconductor/semiconductor multilayers
similarity 0.88S. V. Kuplevakhsky et al.
Source status unknown — claims are unverified
Josephson effect in graphene superconductor/barrier/superconductor junctions: Oscillatory behavior of the Josephson current
similarity 0.88Moitri Maiti & K. Sengupta
Source status unknown — claims are unverified
Effect of quantum noise and tunneling on the fluctuational voltage-current characteristics and the lifetime of the zero-voltage state in Josephson junctions
similarity 0.87V. I. Mel’nikov & A. Sütö
Source status unknown — claims are unverified