Interplay between Static and Dynamic Properties of Semifluxons in YBa2Cu3O7−δ 0−π Josephson Junctions
K. Cedergren, J. R. Kirtley, T. Bauch, G. Rotoli, A. Troeman, H. Hilgenkamp, F. Tafuri, F. Lombardi
DOI 10.1103/PhysRevLett.104.177003 · Physical Review Letters
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Abstract
We have investigated the static and dynamic properties of long YBa2Cu3O7−δ 0−π Josephson junctions and compared them with those of conventional 0 junctions. Scanning SQUID microscope imaging has revealed the presence of a semifluxon at the phase discontinuity point in 0−π Josephson junctions. Zero field steps have been detected in the current-voltage characteristics of all junctions. Comparison with simulation allows us to attribute these steps to fluxons traveling in the junction for conventional 0 junctions and to fluxon-semifluxon interactions in the case of 0−π Josephson junctions.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| YBa2Cu3O7-δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 89 | Pressure not reported | unknown |
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