Understanding Quality Factor Degradation in Superconducting Niobium Cavities at Low Microwave Field Amplitudes
A. Romanenko, D. I. Schuster
DOI 10.1103/PhysRevLett.119.264801 · Physical Review Letters
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Abstract
In niobium superconducting radio frequency (SRF) cavities for particle acceleration, a decrease of the quality factor at lower fields—a so-called low field Q slope or LFQS—has been a long-standing unexplained effect. By extending the high Q measurement techniques to ultralow fields, we discover two previously unknown features of the effect: (i) saturation at rf fields lower than Eacc∼0.1 MV/m; (ii) strong degradation enhancement by growing thicker niobium pentoxide. Our findings suggest that the LFQS may be caused by the two level systems in the natural niobium oxide on the inner cavity surface, thereby identifying a new source of residual resistance and providing guidance for potential nonaccelerator low-field applications of SRF cavities.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 9.2 | Pressure not reported | unknown |
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