Benchmarking the Readout of a Superconducting Qubit for Repeated Measurements
S. Hazra, W. Dai, T. Connolly, P. D. Kurilovich, Z. Wang, L. Frunzio, M. H. Devoret
DOI 10.1103/PhysRevLett.134.100601 · Physical Review Letters
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Abstract
Readout of superconducting qubits faces a trade-off between measurement speed and unwanted backaction on the qubit caused by the readout drive, such as T1 degradation and leakage out of the computational subspace. The readout is typically benchmarked by integrating the readout signal and choosing a binary threshold to extract the “readout fidelity.” We show that readout fidelity may significantly overlook readout-induced leakage errors. Such errors are detrimental for applications that rely on continuously repeated measurements, e.g., quantum error correction. We introduce a method to measure the readout-induced leakage rate by repeatedly executing a composite operation—a readout preceded by a randomized qubit flip. We apply this technique to characterize the readout of a superconducting qubit, optimized for fidelity across four different readout durations. Our technique highlights the importance of an independent leakage characterization by showing that the leakage rates vary from 0.12% to 7.76% across these readouts even though the fidelity exceeds 99.5% in all four cases.
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