← Back to search

Measurement of the Intrinsic Subgap Dissipation in Josephson Junctions

J. R. Kirtley, C. D. Tesche, W. J. Gallagher, A. W. Kleinsasser, R. L. Sandstrom, S. I. Raider, M. P. A. Fisher

DOI 10.1103/PhysRevLett.61.2372 · Physical Review Letters

T1

Active bibliographic source — not scientific approval

Bibliographic access preserves source history; it does not approve extracted materials or validate reported claims. Review warnings on each occurrence separately.

Abstract

We show that the subgap dissipation in sufficiently high-quality Josephson junctions, as measured directly from the current at which the junctions switch from the voltage state into the zero-voltage state, is controlled by thermally excited quasiparticle tunneling. The dissipation is in excellent agreement with a recent theory of Chen, Fisher, and Leggett.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
Nb

Archive — visibility unverified

Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

9.3Pressure not reportedunknown
PbAuIn

Archive — visibility unverified

Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

7Pressure not reportedunknown

Similar papers