Thermally activated phase slippage in high-Tc grain-boundary Josephson junctions
R. Gross, P. Chaudhari, D. Dimos, A. Gupta, G. Koren
DOI 10.1103/PhysRevLett.64.228 · Physical Review Letters
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Abstract
The effect of thermally activated phase slippage (TAPS) in YBa2Cu3O7 grain-boundary Josephson junctions has been studied. TAPS has been found to be responsible for the dc noise voltage superimposed on the dc Josephson current near the transition temperature. Because of the reduced Josephson coupling energy of the grain-boundary junctions, which is caused by a reduced superconducting order parameter at the grain-boundary interface, TAPS is present over a considerable temperature range. The implications of TAPS on the applicability of high-Tc Josephson junctions are outlined.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| YBa2Cu3O7 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 94 | Pressure not reported | onset |
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