New noise exponents in random conductor-superconductor and conductor-insulator mixtures
L. B. Kiss, P. Svedlindh
DOI 10.1103/PhysRevLett.71.2817 · Physical Review Letters
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Abstract
Time dependent fluctuations of the fraction of normal-conducting part in random resistor-superconductor (RS) and resistor-insulator (RI) networks lead to a novel effect close to the percolation threshold. The normalized noise scales as a function of the resistance with a characteristic exponent λ. The value of λ is different from the value found in classical percolation models but can be related to the resistivity exponent s (t) of the RS (RI) transition by a simple scaling relation: λ=2/s (2/t). Results of recent experiments on high-Tc superconducting thin films are interpreted in terms of this new effect and a crossover from three to two dimensional percolation behavior is found.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| YBa2Cu3O7 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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