Electromagnetic properties at the grain boundary interface of a YBa2Cu3O7−δ bicrystal Josephson junction
D. Winkler, Y. M. Zhang, P. Å. Nilsson, E. A. Stepantsov, T. Claeson
DOI 10.1103/PhysRevLett.72.1260 · Physical Review Letters
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Abstract
Electromagnetic resonances along a YBa2Cu3O7−δ bicrystal grain boundary junction made it possible to determine the ratio between the barrier/boundary thickness and the relative dielectric constant td/ɛr, the London penetration depth λL, and to estimate the surface resistance Rs at the interfaces of the grains. From resonances at 256–638 GHz, their Q values, and the Stewart-McCumber parameter, we find td/ɛr≊0.4 nm, λL=140±30 nm, and Rs∼20 mΩ at f=280 GHz. This indicates that the boundary is dielectric, and that the grains are well superconducting within 5–20 nm from the boundary interfaces.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| YBa2Cu3O7-δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 90 | Pressure not reported | unknown |
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