Observation of Photon-Assisted Noise in a Diffusive Normal Metal–Superconductor Junction
A. A. Kozhevnikov, R. J. Schoelkopf, D. E. Prober
DOI 10.1103/PhysRevLett.84.3398 · Physical Review Letters
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Abstract
We report measurements of nonequilibrium noise in a diffusive normal metal–superconductor (N-S) junction in the presence of both dc bias and high-frequency ac excitation. We find that the shot noise of a diffusive N-S junction is doubled compared to a normal diffusive conductor. Under ac excitation of frequency ν the shot noise develops features at bias voltages |V|=hν/(2e), which bear all the hallmarks of a photon-assisted process. Observation of these features provides clear evidence that the effective charge of the current carriers is 2e, due to Andreev reflection.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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