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Microwave Electrodynamics of Electron-Doped Cuprate Superconductors

J. David Kokales, Patrick Fournier, Lucia V. Mercaldo, Vladimir V. Talanov, Richard L. Greene, Steven M. Anlage

DOI 10.1103/PhysRevLett.85.3696 · Physical Review Letters

T1

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Abstract

We report microwave cavity perturbation measurements of the temperature dependence of the penetration depth, λ(T), and conductivity, σ(T) of Pr2−xCexCuO4−δ (PCCO) crystals, as well as parallel-plate resonator measurements of λ(T) in PCCO thin films. Penetration depth measurements are also presented for a Nd2−xCexCuO4−δ (NCCO) crystal. We find that Δλ(T) has a power-law behavior for T<Tc/3, and conclude that the electron-doped cuprate superconductors have nodes in the superconducting gap. Furthermore, using the surface impedance, we have derived the real part of the conductivity, σ1(T), below Tc and found a behavior similar to that observed in hole-doped cuprates.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
Pr1.85Ce0.15CuO4-δ

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19Pressure not reportedmidpoint
Pr2-xCexCuO4-δ

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20Pressure not reportedunknown
Nd2-xCexCuO4-δ

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24Pressure not reportedunknown
YBa2Cu3O7-δ

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—Pressure not reportedunknown
Bi2Sr2CaCu2O8+δ

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—Pressure not reportedunknown

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