Collapse of Thermal Activation in Moderately Damped Josephson Junctions

V. M. Krasnov; T. Bauch; S. Intiso; E. Hürfeld; T. Akazaki; H. Takayanagi; P. Delsing

doi:10.1103/PhysRevLett.95.157002

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Collapse of Thermal Activation in Moderately Damped Josephson Junctions

V. M. Krasnov, T. Bauch, S. Intiso, E. Hürfeld, T. Akazaki, H. Takayanagi, P. Delsing

DOI 10.1103/PhysRevLett.95.157002 · Physical Review Letters

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Abstract

We study switching current statistics in moderately damped Nb-InAs-Nb and intrinsic Bi2Sr2CaCu2O8+δ Josephson junctions. A paradoxical collapse of thermal activation with increasing temperature is reported and explained by the interplay of two conflicting consequences of thermal fluctuations, which can both assist in premature escape and help in retrapping back into the stationary state. We analyze the influence of dissipation on the thermal escape by tuning damping with a gate voltage, magnetic field, temperature, and an in situ capacitor.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
Bi2Sr2CaCu2O8+δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	93	Pressure not reported	unknown