A semi-empirical model for two-level system noise in superconducting microresonators
Jiansong Gao, Miguel Daal, John M. Martinis, Benjamin A. Mazin, Peter K. Day, Henry G. Leduc, Anastasios Vayonakis, Bernard Sadoulet, Jonas Zmuidzinas
arXiv:0804.0467 · DOI 10.1063/1.2937855 · 2008-04-03 · Applied Physics Letters
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Abstract
We present measurements of the low--temperature excess frequency noise of four niobium superconducting coplanar waveguide microresonators, with center strip widths $s_r$ ranging from 3 $μ$m to 20 $μ$m. For a fixed internal power, we find that the frequency noise decreases rapidly with increasing center strip width, scaling as $1/s_r^{1.6}$. We show that this geometrical scaling is readily explained by a simple semi-empirical model which assumes a surface distribution of independent two-level system fluctuators. These results allow the resonator geometry to be optimized for minimum noise.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 9.2 | Pressure not reported | unknown |
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