Temperature Dependence of Critical Current Fluctuations in Nb/AlO$\mathrm{_{x}}$/Nb Josephson Junctions

Shawn Pottorf; Vijay Patel; James E. Lukens

doi:10.1063/1.3074446

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Temperature Dependence of Critical Current Fluctuations in Nb/AlO$\mathrm{_{x}}$/Nb Josephson Junctions

Shawn Pottorf, Vijay Patel, James E. Lukens

arXiv:0809.3272 · DOI 10.1063/1.3074446 · 2008-09-19 · Applied Physics Letters

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Abstract

We have measured the low frequency critical current noise in Nb/AlO$_{\mathrm{x}}$/Nb Josephson junctions. Unshunted junctions biased above the gap voltage and resistively shunted junctions biased near the critical current, $I_{c}$, have been measured. For both, the spectral density of $δI_{c}/I_{c}$, $S_{i_{c}}(f)$, is proportional to $1/f$, scales inversely as the area, $A$, and is independent of $J_{c} \equiv I_{c}/A$ over a factor of nearly 20 in $J_{c}$. For all devices measured at 4.2 K, $S_{i_{c}}$(1 Hz)$= 2.0 \pm 0.4 \cdot 10^{-12}$/Hz when scaled to A=1 $μ$m$^{2}$. We find that, from 4.2 K to 0.46 K, $S_{i_{c}}(f)$ decreases linearly with temperature.