Evidence for Two Time Scales in Long SNS Junctions

F. Chiodi; M. Aprili; B. Reulet

doi:10.1103/PhysRevLett.103.177002

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Evidence for Two Time Scales in Long SNS Junctions

F. Chiodi, M. Aprili, B. Reulet

arXiv:0908.1070 · DOI 10.1103/PhysRevLett.103.177002 · 2009-08-07 · Physical review letters

T1experimental16 citations

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Abstract

We use microwave excitation to elucidate the dynamics of long superconductor / normal metal / superconductor Josephson junctions. By varying the excitation frequency in the range 10 MHz - 40 GHz, we observe that the critical and retrapping currents, deduced from the dc voltage vs. dc current characteristics of the junction, are set by two different time scales. The critical current increases when the ac frequency is larger than the inverse diffusion time in the normal metal, whereas the retrapping current is strongly modified when the excitation frequency is above the electron-phonon rate in the normal metal. Therefore the critical and retrapping currents are associated with elastic and inelastic scattering, respectively.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	7.4	Pressure not reported	unknown