All silicon Josephson junctions

Abstract

We have realised laser-doped all-silicon superconducting (S)/ normal metal (N) bilayers of tunable thickness and dopant concentration. We observed a strong reduction of the bilayers critical temperature when increasing the normal metal thickness, a signature of the highly transparent S/N interface associated to the epitaxial sharp laser doping profile. We extracted the interface resistance by fitting with the linearised Usadel equations, demonstrating a reduction of one order of magnitude from previous superconductor/doped Si interfaces. In this well controlled crystalline system we exploited the low resistance S/N interfaces to elaborate all-silicon lateral SNS Josephson junctions with long range proximity effect. Their dc transport properties, such as the critical and retrapping currents, could be well understood in the diffusive regime. Furthermore, this work lead to the estimation of important parameters in ultra-doped superconducting Si, such as the Fermi velocity, the coherence length, or the electron-phonon coupling constant, fundamental to conceive an all-silicon superconducting electronics.

Source-reported materials — not catalogue approval

Similar papers