Direct measurements of the penetration depth in a superconducting film using magnetic force microscopy

E. Nazaretski; J. P. Thibodaux; I. Vekhter; L. Civale; J. D. Thompson; R. Movshovich

doi:10.1063/1.3276563

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Direct measurements of the penetration depth in a superconducting film using magnetic force microscopy

E. Nazaretski, J. P. Thibodaux, I. Vekhter, L. Civale, J. D. Thompson, R. Movshovich

arXiv:0909.1360 · DOI 10.1063/1.3276563 · 2009-09-07

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Abstract

We report the local measurements of the magnetic penetration depth $λ$ in a superconducting Nb film using magnetic force microscopy (MFM). We developed a method for quantitative extraction of the penetration depth from single-parameter simultaneous fits to the lateral and height profiles of the MFM signal, and demonstrate that the obtained value is in excellent agreement with that obtained from the bulk magnetization measurements.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	—	Pressure not reported	—