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Direct measurement of the magnetic penetration depth by magnetic force microscopy

Jeehoon Kim, L. Civale, E. Nazaretski, N. Haberkorn, F. Ronning, A. S. Sefat, T. Tajima, B. H. Moeckly, J. D. Thompson, R. Movshovich

arXiv:1206.4525 · DOI 10.1088/0953-2048/25/11/112001 · 2012-06-20 · Superconductor Science and Technology

T1experimental27 citations

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Abstract

We present an experimental approach using magnetic force microscopy for measurements of the absolute value of the magnetic penetration depth $λ$ in superconductors. $λ$ is obtained in a simple and robust way without introducing any tip modeling procedure via direct comparison of the Meissner response curves for a material of interest to those measured on a reference sample. Using a well-characterized Nb film as a reference, we determine the absolute value of $λ$ in a Ba(Fe$_{0.92}$Co$_{0.08}$)$_{2}$As$_{2}$ single crystal and a MgB$_2$ thin film through a comparative experiment. Our apparatus features simultaneous loading of multiple samples, and allows straightforward measurement of the absolute value of $λ$ in superconducting thin film or single crystal samples.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
Nb

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8.8Pressure not reportedzero_resistance
Ba(Fe0.92Co0.08)2As2

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22Pressure not reportedunknown
MgB2

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38.3Pressure not reportedzero_resistance

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