Magnetic resonance spectroscopy of single centers in silicon quantum wells
Nikolay T. Bagraev, Leonid E. Klyachkin, Andrey A. Kudryavtsev, Anna M. Malyarenko
arXiv:0910.3864 · DOI 10.1016/j.physb.2009.08.248 · 2009-10-20 · Physica B-condensed Matter
Active bibliographic source — not scientific approval
Bibliographic access preserves source history; it does not approve extracted materials or validate reported claims. Review warnings on each occurrence separately.
Abstract
We present the new optically-detected magnetic resonance (ODMR) technique which reveals single point defects in silicon quantum wells embedded in microcavities within frameworks of the excitonic normal-mode coupling (NMC) without the external cavity and the hf source.
Similar papers
Electrically-Detected ESR in Silicon Nanostructures Inserted in Microcavities
similarity 0.90Nikolay Bagraev et al. · 2013 · arXiv:1308.5082
Source status unknown — claims are unverified
EDEPR of impurity centers embedded in silicon microcavities
similarity 0.89N. T. Bagraev et al. · 2009 · arXiv:0910.3851
Source status unknown — claims are unverified
Coupling a single nitrogen-vacancy center to a superconducting flux qubit in the far-off-resonance regime
similarity 0.84Tom Douce et al.
Source status unknown — claims are unverified
Inelastic tunneling spectroscopy in a d-wave superconductor
similarity 0.84A. V. Balatsky et al.
Source status unknown — claims are unverified
Characterizing two-dimensional superconductivity via nanoscale noise magnetometry with single-spin qubits
similarity 0.83Pavel E. Dolgirev et al.
Source status unknown — claims are unverified
Resonant and off-resonant microwave signal manipulation in coupled superconducting resonators
similarity 0.82Mathieu Pierre et al.
Source status unknown — claims are unverified