Electrically-Detected ESR in Silicon Nanostructures Inserted in Microcavities

Nikolay Bagraev; Eduard Danilovskii; Wolfgang Gehlhoff; Dmitrii Gets; Leonid Klyachkin; Andrey Kudryavtsev; Roman Kuzmin; Anna Malyarenko; Vladimir Mashkov; Vladimir Romanov

doi:10.1063/1.4865648

Electrically-Detected ESR in Silicon Nanostructures Inserted in Microcavities

Nikolay Bagraev, Eduard Danilovskii, Wolfgang Gehlhoff, Dmitrii Gets, Leonid Klyachkin, Andrey Kudryavtsev, Roman Kuzmin, Anna Malyarenko, Vladimir Mashkov, Vladimir Romanov

arXiv:1308.5082 · DOI 10.1063/1.4865648 · 2013-08-23 · arXiv: Mesoscale and Nanoscale Physics

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Abstract

We present the first findings of the new electrically-detected electron spin resonance technique (EDESR), which reveal the point defects in the ultra-narrow silicon quantum wells (Si-QW) confined by the superconductor delta-barriers. This technique allows the ESR identification without application of an external cavity, as well as a high frequency source and recorder, and with measuring the only response of the magnetoresistance, with internal GHz Josephson emission within frameworks of the normal-mode coupling (NMC) caused by the microcavities embedded in the Si-QW plane.