Andreev reflection measurements in nanostructures with amorphous WC$_x$ superconducting contacts

J. Barzola-Quiquia; M. Ziese; P. Esquinazi; N. Garcia

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Andreev reflection measurements in nanostructures with amorphous WC$_x$ superconducting contacts

J. Barzola-Quiquia, M. Ziese, P. Esquinazi, N. Garcia

arXiv:0912.1270 · 2009-12-07 · arXiv: Superconductivity

T2theoretical

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Abstract

Point-contact Andreev reflection measurements of Co/ and Cu/tungsten-carbide (WC$_x$) contacts are presented. Metallic thin films were patterned by e-beam-lithography and lift-off; tungsten carbide superconducting tips were grown directly on the pre-patterned samples by decomposition of a metallo-organic vapour (tungsten hexacarbonyl) under a focused Ga$^+$-ion beam (FIB). Current-voltage measurements as a function of temperature and magnetic field clearly showed the signatures of Andreev reflection. The experimental conductance-voltage curves were analyzed within the Blonder-Tinkham-Klapwijk theory. The results highlight the possibilities, advantages and disadvantages of using FIB-produced amorphous WC$_x$ tips for point-contact spectroscopy in metallic nanostructures.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
WCx Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	4.1	Pressure not reported	unknown
WCx Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	5	Pressure not reported	unknown