Thin film dielectric microstrip kinetic inductance detectors

B. A. Mazin; D. Sank; S. McHugh; E. A. Lucero; A. Merrill; J. Gao; D. Pappas; D. Moore; J. Zmuidzinas

doi:10.1063/1.3314281

← Back to search

Thin film dielectric microstrip kinetic inductance detectors

B. A. Mazin, D. Sank, S. McHugh, E. A. Lucero, A. Merrill, J. Gao, D. Pappas, D. Moore, J. Zmuidzinas

arXiv:1002.0301 · DOI 10.1063/1.3314281 · 2010-02-01 · Applied Physics Letters

T1theoretical36 citations

Active bibliographic source — not scientific approval

Bibliographic access preserves source history; it does not approve extracted materials or validate reported claims. Review warnings on each occurrence separately.

Abstract

Microwave Kinetic Inductance Detectors, or MKIDs, are a type of low temperature detector that exhibit intrinsic frequency domain multiplexing at microwave frequencies. We present the first theory and measurements on a MKID based on a microstrip transmission line resonator. A complete characterization of the dielectric loss and noise properties of these resonators is performed, and agrees well with the derived theory. A competitive noise equivalent power of 5$\times10^{-17}$ W Hz$^{-1/2}$ at 1 Hz has been demonstrated. The resonators exhibit the highest quality factors known in a microstrip resonator with a deposited thin film dielectric.