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Zn-impurity effects on quasi-particle scattering in La2-xSrxCuO4 studied by angle-resolved photoemission spectroscopy

T. Yoshida, Seiki Komiya, X. J. Zhou, K. Tanaka, A. Fujimori, Z. Hussain, Z. -X. Shen, Yoichi Ando, H. Eisaki, S. Uchida

arXiv:1003.2267 · 2010-03-11

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Abstract

Angle-resolved photoemission measurements were performed on Zn-doped La2-xSrxCuO4 (LSCO) to investigate the effects of Zn impurities on the low energy electronic structure. The Zn-impurity-induced increase in the quasi-particle (QP) width in momentum distribution curves (MDC) is approximately isotropic on the entire Fermi surface and energy-independent near the Fermi level (EF). The increase in the MDC width is consistent with the increase in the residual resistivity due to the Zn impurities if we assume the carrier number to be 1-x for x=0.17 and the Zn impurity to be a potential scatterer close to the unitarity limit. For x=0.03, the residual resistivity is found to be higher than that expected from the MDC width, and the effects of antifferomagnetic fluctuations induced around the Zn impurities are discussed. The leading edges of the spectra near (pi,0) for x=0.17 are shifted toward higher energies relative to EF with Zn substitution, indicating a reduction of the superconducting gap.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
La2-xSrxCuO4

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40Pressure not reportedunknown
La2-xSrxCu1-yZnyO4

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22Pressure not reportedunknown

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