Flux noise in ion-implanted nanoSQUIDs
Giuseppe C. Tettamanzi, Christopher I. Pakes, Simon K. H. Lam, Steven Prawer
arXiv:1003.5436 · DOI 10.1088/0953-2048/22/6/064006 · 2010-03-29 · Superconductor Science and Technology
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Abstract
Focused ion beam (FIB) technology has been used to fabricate miniature Nb DC SQUIDs which incorporate resistively-shunted microbridge junctions and a central loop with a hole diameter ranging from 1058 nm to 50 nm. The smallest device, with a 50 nm hole diameter, has a white flux noise level of 2.6 microphy_{0}/Hz^{0.5} at 10^{4} Hz. The scaling of the flux noise properties and focusing effect of the SQUID with the hole size were examined. The observed low-frequency flux noise of different devices were compared with the contribution due to the spin fluctuation of defects during FIB processing and the thermally activated flux hopping in the SQUID washer.
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