Analysis of impedance and noise data of an X-ray transition-edge sensor using complex thermal models

M. R. J. Palosaari; K. M. Kinnunen; M. L. Ridder; J. van der Kuur; H. F. C. Hoevers; I. J. Maasilta

Analysis of impedance and noise data of an X-ray transition-edge sensor using complex thermal models

M. R. J. Palosaari, K. M. Kinnunen, M. L. Ridder, J. van der Kuur, H. F. C. Hoevers, I. J. Maasilta

arXiv:1112.0400 · 2011-12-02

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Abstract

The so-called excess noise limits the energy resolution of transition-edge sensor (TES) detectors, and its physical origin has been unclear, with many competing models proposed. Here we present the noise and impedance data analysis of a rectangular X-ray Ti/Au TES fabricated at SRON. To account for all the major features in the impedance and noise data simultaneously, we have used a thermal model consisting of three blocks of heat capacities, whereas a two-block model is clearly insufficient. The implication is that, for these detectors, the excess noise is simply thermal fluctuation noise of the internal parts of the device. Equations for the impedance and noise for a three-block model are also given.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
Ti/Au Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	0.1255	Pressure not reported	unknown