Scanning microscopies of superconductors at very low temperatures

V. Crespo; A. Maldonado; J. A. Galvis; P. Kulkarni; I. Guillamon; J. G. Rodrigo; H. Suderow; S. Vieira; S. Banerjee; P. Rodiere

doi:10.1016/j.physc.2012.02.014

Scanning microscopies of superconductors at very low temperatures

V. Crespo, A. Maldonado, J. A. Galvis, P. Kulkarni, I. Guillamon, J. G. Rodrigo, H. Suderow, S. Vieira, S. Banerjee, P. Rodiere

arXiv:1201.1868 · DOI 10.1016/j.physc.2012.02.014 · 2012-01-09 · Physica C-superconductivity and Its Applications

T1experimental7 citations

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Abstract

We discuss basics of scanning tunneling microscopy and spectroscopy (STM/S) of the superconducting state with normal and superconducting tips. We present a new method to measure the local variations in the Andreev reflection amplitude between a superconducting tip and the sample. This method is termed Scanning Andreev Reflection Spectroscopy (SAS). We also briefly discuss vortex imaging with STM/S under an applied current through the sample, and show the vortex lattice as a function of the angle between the magnetic field and sample's surface.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
NbSe2 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	—	Pressure not reported	unknown
Pb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	—	Pressure not reported	unknown