Loss tangent measurements of dielectric substrates from 15 K to 300 K with two resonators: investigation into accuracy issues
Janina E. Mazierska, Mohan V. Jacob, Dimitri O. Ledenyov, Jerzy Krupka
arXiv:1210.2230 · DOI 10.1109/APMC.2005.1606805 · 2012-10-08 · 2005 Asia-Pacific Microwave Conference Proceedings
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Abstract
The loss tangent of medium, low and very low loss dielectric substrates (including the Rogers RT Duroid 5880 and 6010.2, LaAlO3, (La, Sr)(Al, Ta)O3, MgO and Quartz) was measured at varying temperatures with two TE01δ dielectric resonators to ensure verification of the tests. The accuracy of the measurements has been researched and discussed for split post dielectric resonator (SPDR) in a copper enclosure and a single post dielectric resonator (SuPDR) in a superconducting enclosure in the temperature range from 15K to 300 K.
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