Near-Field Microwave Magnetic Nanoscopy of Superconducting Radio Frequency Cavity Materials
Tamin Tai, Behnood G. Ghamsari, Thomas R. Bieler, Teng Tan, X. X. Xi, Steven M. Anlage
arXiv:1312.6257 · DOI 10.1063/1.4881880 · 2013-12-21 · Applied Physics Letters
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Abstract
A localized measurement of the RF critical field on superconducting radio frequency (SRF) cavity materials is a key step to identify specific defects that produce quenches of SRF cavities. Two new measurements are performed to demonstrate these capabilities with a novel near-field scanning probe microwave microscope. The first is a third harmonic nonlinear measurement on a high Residual- Resistance-Ratio bulk Nb sample showing strong localized nonlinear response for the first time, with surface RF magnetic field $B_{surface} \sim 10^{2}$ $mT$. The second is a raster scanned harmonic response image on a high quality $MgB_{2}$ thin film demonstrating a quench defect-free surface over large areas.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 9.2 | Pressure not reported | unknown |
| MgB2 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | — |
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