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Soft x-ray photoemission study of new BiS$_{2}$-layered superconductor LaO$_{1-x}$F$_{x}$BiS$_{2}$

Shinsuke Nagira, Junki Sonoyama, Takanori Wakita, Masanori Sunagawa, Yudai Izumi, Takayuki Muro, Hiroshi Kumigashira, Masaharu Oshima, Keita Deguchi, Hiroyuki Okazaki, Yoshihiko Takano, Osuke Miura, Yoshikazu Mizuguchi, Katsuhiro Suzuki, Hidetomo Usui, Kazuhiko Kuroki, Kozo Okada, Yuji Muraoka, Takayoshi Yokoya

arXiv:1401.5173 · DOI 10.7566/JPSJ.83.033703 · 2014-01-21 · Journal of the Physical Society of Japan

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Abstract

We use core level and valence band soft x-ray photoemission spectroscopy (SXPES) to investigate electronic structure of new BiS$_{2}$ layered superconductor LaO$_{1-x}$F$_{x}$BiS$_{2}$. Core level spectra of doped samples show a new spectral feature at the lower binding energy side of the Bi 4${f}$ main peak, which may be explained by core-hole screening with metallic states near the Fermi level ($E_{\rm F}$). Experimental electronic structure and its ${x}$ dependence (higher binding energy shift of the valence band as well as appearance of new states near $E_{\rm F}$ having dominant Bi 6${p}$ character) were found to be consistent with the predictions of band structure calculations in general. Noticeable deviation of the spectral shape of the states near $E_{\rm F}$ from that of calculations might give insight into the interesting physical properties. These results provide first experimental electronic structure of the new BiS$_{2}$ layered superconductors.

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