Superconducting single X-ray photon detector based on W0.8Si0.2

X. Zhang; Q. Wang; A. Schilling

doi:10.1063/1.4967278

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Superconducting single X-ray photon detector based on W0.8Si0.2

X. Zhang, Q. Wang, A. Schilling

arXiv:1608.02347 · DOI 10.1063/1.4967278 · 2016-08-08 · AIP Advances

T1theoretical12 citations

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Abstract

We fabricated a superconducting single X-ray photon detector based on W0.8Si0.2, and we characterized its basic detection performance for keV-photons at different temperatures. The detector has a critical temperature of 4.97 K, and it is able to be operated up to 4.8 K, just below the critical temperature. The detector starts to react to X-ray photons at relatively low bias currents, less than 1% of Ic at T = 1.8 K, and it shows a saturated count rate dependence on bias current at all temperatures, indicating that the optimum internal quantum efficiency can always be reached. Dark counts are negligible up to the highest investigated bias currents (99% of Ic) and operating temperature (4.8 K). The latching effect affects the detector performance at all temperatures due to the fast recovery of the bias current; however, further modifications of the device geometry are expected to reduce the tendency for latching.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
W0.8Si0.2 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	4.97	Pressure not reported	unknown