Characterizing the attenuation of coaxial and rectangular microwave-frequency waveguides at cryogenic temperatures
P. Kurpiers, T. Walter, P. Magnard, Y. Salathe, A. Wallraff
arXiv:1612.07977 · DOI 10.1140/epjqt/s40507-017-0059-7 · 2016-12-23 · Epj Quantum Technology
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Abstract
Low-loss waveguides are required for quantum communication at distances beyond the chip-scale for any low-temperature solid-state implementation of quantum information processors. We measure and analyze the attenuation constant of commercially available microwave-frequency waveguides down to millikelvin temperatures and single photon levels. More specifically, we characterize the frequency-dependent loss of a range of coaxial and rectangular microwave waveguides down to $0.005\,\rm{dB}/\rm{m}$ using a resonant-cavity technique. We study the loss tangent and relative permittivity of commonly used dielectric waveguide materials by measurements of the internal quality factors and their comparison with established loss models. The results of our characterization are relevant for accurately predicting the signal levels at the input of cryogenic devices, for reducing the loss in any detection chain, and for estimating the heat load induced by signal dissipation in cryogenic systems.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| NbTi Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | — |
| Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | — |
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