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Distortions to the penetration depth and coherence length of superconductor/normal-metal superlattices

P. Quarterman, Nathan Satchell, B. J. Kirby, Reza Loloee, Gavin Burnell, Norman O. Birge, J. A. Borchers

arXiv:2001.09310 · DOI 10.1103/PHYSREVMATERIALS.4.074801 · 2020-01-25 · Physical Review Materials

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Abstract

Superconducting ($S$) thin film superlattices composed of Nb and a normal metal spacer ($N$) have been extensively utilized in Josephson junctions given their favorable surface roughness compared to Nb films of comparable thickness. In this work, we characterize the London penetration depth and Ginzburg-Landau coherence lengths of $S/N$ superlattices using polarized neutron reflectometry and electrical transport. Despite the normal metal spacer layers being only approximately 8% of the total superlattice thickness, we surprisingly find that the introduction of these thin $N$ spacers between $S$ layers leads to a dramatic increase in the measured London penetration depth compared to that of a single Nb film of comparable thickness. Using the measured values for the effective in- and out-of-plane coherence lengths, we quantify the induced anisotropy of the superlattice samples and compare to a single Nb film sample. From these results, we find that that the superlattices behave similarly to layered 2D superconductors.

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FormulaReported Tc (K)Pressure (GPa)Type
Nb

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—Pressure unresolved—

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