Multiple Andreev reflections in diffusive SINIS and SIFIS junctions

A. V. Polkin; P. A. Ioselevich

doi:10.21468/scipostphys.15.3.100

← Back to search

Multiple Andreev reflections in diffusive SINIS and SIFIS junctions

A. V. Polkin, P. A. Ioselevich

arXiv:2209.07343 · DOI 10.21468/scipostphys.15.3.100 · 2022-09-15 · SciPost Physics

T3experimental1 citations

Active bibliographic source — not scientific approval

Bibliographic access preserves source history; it does not approve extracted materials or validate reported claims. Review warnings on each occurrence separately.

Abstract

We study Multiple Andreev Reflections in long diffusive superconductor(S)-normal metal(N)-superconductor junctions with low-transparency interfaces. Assuming strong thermalization in the weak link we calculate the current-voltage dependence $I(V)$. At intermediate temperatures, $E_\mathrm{Th}\ll T\llΔ$, the current is dominated by noncoherent multiple Andreev reflections and is obtained analytically. The results are generalized to a ferromagnetic junction. We find that the exchange field produces a non-trivial splitting of the subharmonic gap structure. This effect relies on thermalization and vanishes in SFS junctions with no energy relaxation in the weak link.