Structural analysis and transport properties of [010]-tilt grain boundaries in Fe(Se,Te)
Kazumasa Iida, Yoshihiro Yamauchi, Takafumi Hatano, Kai Walter, Bernhard Holzapfel, Jens Hänisch, Zimeng Guo, Hongye Gao, Haoshan Shi, Shinnosuke Tokuta, Satoshi Hata, Akiyasu Yamamoto, Hiroshi Ikuta
arXiv:2409.12847 · DOI 10.1080/14686996.2024.2384829 · 2024-09-19 · Science and Technology of Advanced Materials
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Abstract
Understanding the nature of grain boundaries is a prerequisite for fabricating high-performance superconducting bulks and wires. For iron-based superconductors [e.g. Ba(Fe,Co)$_2$As$_2$, Fe(Se,Te), and NdFeAs(O,F)], the dependence of the critical current density $J_\mathrm{c}$ on misorientation angle ($θ_\mathrm{GB}$) has been explored on [001]-tilt grain boundaries, but no data for other types of orientations have been reported. Here, we report on the structural and transport properties of Fe(Se,Te) grown on CeO$_2$-buffered symmetric [010]-tilt roof-type SrTiO$_3$ bicrystal substrates by pulsed laser deposition. X-ray diffraction and transmission electron microscopy revealed that $θ_\mathrm{GB}$ of Fe(Se,Te) was smaller whereas $θ_\mathrm{GB}$ of CeO$_2$ was larger than that of the substrate. The difference in $θ_\mathrm{GB}$ between the CeO$_2$ buffer layer and the substrate is getting larger with increasing $θ_\mathrm{GB}$. For $θ_\mathrm{GB}\geq24^\circ$ of the substrates, $θ_\mathrm{GB}$ of Fe(Se,Te) was zero, whereas $θ_\mathrm{GB}$ of CeO$_2$ was continuously increasing. The inclined growth of CeO$_2$ can be explained by the geometrical coherency model. The $c$-axis growth of Fe(Se,Te) for $θ_\mathrm{GB}\geq24^\circ$ of the substrates is due to the domain matching epitaxy on (221) planes of CeO$_2$. Electrical transport measurements confirmed no reduction of inter-grain $J_\mathrm{c}$ for $θ_\mathrm{GB}\leq9^\circ$, indicative of strong coupling between the grains.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Fe(Se,Te) Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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