Intrinsic Josephson junction characteristics of Nd2-xCexCuO4/SrTiO3 epitaxial films
T. B. Charikova, D. I. Devyaterikov, V. N. Neverov, M. R. Popov, N. G. Shelushinina, A. A. Ivanov
arXiv:2410.00488 · DOI 10.1016/j.ssc.2024.115723 · 2024-10-01 · Solid State Communications
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Abstract
The current-voltage (I-V) properties along the c axis on Nd2-xCexCuO4 /SrTiO3 epitaxial films with x = 0.145, 0.15 were investigated. For all the samples it has been established that the I-V characteristics exhibit several resistive branches, which correspond to the resistive states of individual Josephson junctions. The results confirm the idea of a tunneling mechanism between the CuO2 layers (superconductor - insulator - superconductor junction) for the investigated Nd2-xCexCuO4 compound. The I-V dependence of this compound with x = 0.15 points out on the nonmonotonic nature of the d-wave or anisotropic s-wave symmetry order parameter associated with the coexistence of superconductivity and antiferromagnetic fluctuations.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Nd2-xCexCuO4 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
| Nd2-xCexCuO4 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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