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Microscopic Investigation of rf Vortex Nucleation in Nb3Sn Films Using a Near-Field Magnetic Microwave Microscope

Chung-Yang Wang, Zeming Sun, Thomas Oseroff, Matthias U. Liepe, Steven M. Anlage

arXiv:2511.15116 · DOI 10.1088/1361-6668/ae438a · 2025-11-19 · Superconductor Science and Technology

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Abstract

We use a near-field magnetic microwave microscope to investigate and compare rf vortex nucleation in two superconducting radio-frequency (SRF)-quality Nb3Sn films fabricated by different methods: a conventional vapor-diffused film and an electrochemically plated film followed by thermal annealing, both of which are deposited on Nb substrates. The microscope applies a localized rf magnetic field to the sample surface and measures the resulting third-harmonic response P3f, which is particularly sensitive to rf vortex nucleation triggered by surface defects. Both Nb3Sn films exhibit nontrivial P3f(T) structures below 7 K that display the key signatures associated with rf vortex nucleation at local defects. The electrochemical film additionally shows multiple P3f(T) structures between 14 K and 16 K that are absent in the vapor-diffused sample. Our results highlight the influence of fabrication method on rf vortex penetration properties and demonstrate the utility of third-harmonic response as a local diagnostic tool for surface defects in Nb3Sn films.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
Nb3Sn

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15.6Pressure not reportedunknown
Nb3Sn

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15.1Pressure not reportedunknown
Nb3Sn

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14.6Pressure not reportedunknown
Nb3Sn

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18Pressure not reportedunknown
NbSn2

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2.68Pressure not reportedunknown
Nb6Sn5

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2.07Pressure not reportedunknown
Sn

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3.72Pressure not reportedunknown

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