Comparison of Two-Level System Microwave Losses in Pure Bulk Microcrystalline Nb2O5 and NbO2 Oxide Samples

Vishal Ganesan; Jiankun Zhang; Drew G. Wild; Alexey Bezryadin

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Comparison of Two-Level System Microwave Losses in Pure Bulk Microcrystalline Nb2O5 and NbO2 Oxide Samples

Vishal Ganesan, Jiankun Zhang, Drew G. Wild, Alexey Bezryadin

arXiv:2601.06668 · 2026-01-10

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Abstract

Losses from two-level systems (TLS) associated with amorphous oxides remain one of the primary limitations to the performance of superconducting qubits and microwave cavities. Niobium resonators are widely used in quantum science experiments, yet niobium's natural oxide layer contains various types of oxides whose relative contributions to TLS loss have not been clearly distinguished. Here, we use a superconducting 3D microwave cavity to measure commercial 99.9\% trace metal pure, microcrystalline oxide powders \ch{Nb2O5} and \ch{NbO2} in bulk amounts. Using this approach, we directly compare the loss characteristics of \ch{Nb2O5} and \ch{NbO2}. Our measurements show that the nominal \ch{Nb2O5} bulk oxide powder samples exhibit losses which have the power and temperature behavior expected for TLS. Moreover, the measurements agree with existing theoretical models. Analogous measurements performed on \ch{NbO2} bulk powder samples do not show any detectable TLS loss signatures. Based on our results we propose that the TLS losses might be reduced if a high quality microcrystalline \ch{NbO2} oxide dominates the \ch{Nb2O5} oxide in practical Nb cavities. These results establish a materials based strategy for isolating oxide specific TLS losses and provide a reference measurement for niobium oxide phases relevant to superconducting quantum devices.