Interpretation of a microwave induced current step in a single intrinsic Josephson junction on a Bi-2223 thin film
Ch. Helm, A. Odagawa, M. Sakai, H. Adachi, K. Setsune
arXiv:cond-mat/0001152 · DOI 10.1016/S0921-4534(00)01435-0 · 2000-01-11 · Physica C-superconductivity and Its Applications
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Abstract
Thin stacks consisting of a single intrinsic Josephson junction on (Bi,Pb)-Sr-Ca-Cu-O thin films are investigated under the influence of external microwave fields. The $I$-$V$-characteristic shows a single resistive branch, a clear superconducting gap edge structure and a pronounced current step in external microwave fields. With increasing irradiation power it shifts to higher voltages, while the height of the step remains practically unchanged. In a numerical simulation including an ac-magnetic field parallel to the superconducting layers the experimental features of the structure can be explained by a collective motion of Josephson fluxons.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| (Bi,Pb)2Sr2Ca2Cu3O10+x Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 100 | Pressure not reported | unknown |
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