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Interpretation of a microwave induced current step in a single intrinsic Josephson junction on a Bi-2223 thin film

Ch. Helm, A. Odagawa, M. Sakai, H. Adachi, K. Setsune

arXiv:cond-mat/0001152 · DOI 10.1016/S0921-4534(00)01435-0 · 2000-01-11 · Physica C-superconductivity and Its Applications

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Abstract

Thin stacks consisting of a single intrinsic Josephson junction on (Bi,Pb)-Sr-Ca-Cu-O thin films are investigated under the influence of external microwave fields. The $I$-$V$-characteristic shows a single resistive branch, a clear superconducting gap edge structure and a pronounced current step in external microwave fields. With increasing irradiation power it shifts to higher voltages, while the height of the step remains practically unchanged. In a numerical simulation including an ac-magnetic field parallel to the superconducting layers the experimental features of the structure can be explained by a collective motion of Josephson fluxons.

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FormulaReported Tc (K)Pressure (GPa)Type
(Bi,Pb)2Sr2Ca2Cu3O10+x

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100Pressure not reportedunknown

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