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Microwave Electrodynamics of Electron-Doped Cuprate Superconductors

J. David Kokales, Patrick Fournier, Lucia V. Mercaldo, Vladimir V. Talanov, Richard L. Greene, Steven M. Anlage

arXiv:cond-mat/0002300 · DOI 10.1103/PhysRevLett.85.3696 · 2000-02-18 · Physical review letters

T1experimental68 citations

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Abstract

We report microwave cavity perturbation measurements of the temperature dependence of the penetration depth, lambda(T), and conductivity, sigma(T) of Pr_{2-x}Ce_{x}CuO_{4-delta} (PCCO) crystals, as well as parallel-plate resonator measurements of lambda(T) in PCCO thin films. Penetration depth measurements are also presented for a Nd_{2-x}Ce_{x}CuO_{4-delta} (NCCO) crystal. We find that delta-lambda(T) has a power-law behavior for T<T_c/3, and conclude that the electron-doped cuprate superconductors have nodes in the superconducting gap. Furthermore, using the surface impedance, we have derived the real part of the conductivity, sigma_1(T), below T_c and found a behavior similar to that observed in hole-doped cuprates.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
Pr1.85Ce0.15CuO4-δ

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19Pressure not reportedunknown
Pr1.85Ce0.15CuO4-δ

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

19Pressure not reportedunknown
Pr1.85Ce0.15CuO4-δ

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

20Pressure not reportedunknown
Pr1.85Ce0.15CuO4-δ

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19Pressure not reportedmidpoint
Nd2-xCexCuO4-δ

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24Pressure not reportedunknown

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