Critical Behavior of Frustrated Josephson Junction Arrays with Bond Disorder
Young-Je Yun, In-Cheol Baek, Mu-Yong Choi
arXiv:cond-mat/0206076 · DOI 10.1103/PhysRevLett.89.037004 · 2002-06-06 · Physical review letters
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Abstract
The scaling behavior of the current-voltage ($IV$) characteristics of a two-dimensional proximity-coupled Josephson junction array (JJA) with quenched bond disorder was investigated for frustrations $f=1/5$, 1/3, 2/5, and 1/2. For all these frustrations including 1/5 and 2/5 where a strongly first-order phase transition is expected in the absence of disorder, the $IV$ characteristics exhibited a good scaling behavior. The critical exponent $ν$ indicates that bond disorder may drive the phase transitions of frustrated JJA's to be continuous but not into the Ising universality class, contrary to what was observed in Monte Carlo simulations. The dynamic critical exponent $z$ for JJA's was found to be only 0.60 - 0.77.
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