Critical Behavior of Frustrated Josephson Junction Arrays with Bond Disorder
Young-Je Yun, In-Cheol Baek, Mu-Yong Choi
DOI 10.1103/PhysRevLett.89.037004 · Physical Review Letters
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Abstract
The scaling behavior of the current-voltage (IV) characteristics of a two-dimensional proximity-coupled Josephson junction array (JJA) with quenched bond disorder was investigated for frustrations f=1/5, 1/3, 2/5, and 1/2. For all these frustrations including 1/5 and 2/5 where a strongly first-order phase transition is expected in the absence of disorder, the IV characteristics exhibited a good scaling behavior. The critical exponent ν indicates that bond disorder may drive the phase transitions to be continuous but not into the Ising universality class, contrary to what was observed in Monte Carlo simulations. The dynamic critical exponent z for JJA’s was found to be only 0.60–0.77.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 6.24 | Pressure unresolved | unknown |
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