Full counting statistics of multiple Andreev reflections
J. C. Cuevas, W. Belzig
arXiv:cond-mat/0308049 · DOI 10.1103/PhysRevLett.91.187001 · 2003-08-04 · Physical review letters
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Abstract
We derive the full distribution of transmitted particles through a superconducting point contact of arbitrary transparency under voltage bias. The charge transport is dominated by multiple Andreev reflections. The counting statistics is a multinomial distribution of processes, in which multiple charges ne (n=1,2,3,...) are transferred through the contact. For zero temperature we obtain analytical expressions for the probabilities of the multiple Andreev reflections. The current, shot noise and high current cumulants in a variety of situations can be obtained from our result.
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