Temperature Dependence of Zero-Bias Resistances of a Single Resistance-Shunted Josephson Junction

Naoki Kimura; Takeo Kato

doi:10.1103/PhysRevB.69.012504

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Temperature Dependence of Zero-Bias Resistances of a Single Resistance-Shunted Josephson Junction

Naoki Kimura, Takeo Kato

arXiv:cond-mat/0309177 · DOI 10.1103/PhysRevB.69.012504 · 2003-09-08 · Physical Review B

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Abstract

Zero-bias resistances of a single resistance-shunted Josephson junction are calculated as a function of the temperature by means of the path-integral Monte Carlo method in case a charging energy $E_{\rm C}$ is comparable with a Josephson energy $E_{\rm J}$. The low-temperature behavior of the zero-bias resistance changes around $α=R_{\rm Q}/R_{\rm S}=1$, where $R_{\rm S}$ is a shunt resistance and $R_{\rm Q}=h/(2e)^2$. The temperature dependence of the zero-bias resistance shows a power-law-like behavior whose exponent depends on $E_{\rm J}/E_{\rm C}$. These results are compared with the experiments on resistance-shunted Josephson junctions.