Resonant inelastic X-ray scattering study of overdoped La$_{2-x}$Sr$_{x}$CuO$_{4}$

Abstract

Resonant inelastic x-ray scattering (RIXS) at the copper K absorption edge has been performed for heavily overdoped samples of La$_{2-x}$Sr$_{x}$CuO$_{4}$ with $x= 0.25$ and 0.30. We have observed the charge transfer and molecular-orbital excitations which exhibit resonances at incident energies of $E_i= 8.992$ and 8.998 keV, respectively. From a comparison with previous results on undoped and optimally-doped samples, we determine that the charge-transfer excitation energy increases monotonically as doping increases. In addition, the $E_i$-dependences of the RIXS spectral weight and absorption spectrum exhibit no clear peak at $E_i = 8.998$ keV in contrast to results in the underdoped samples. The low-energy ($\leq 3$ eV) continuum excitation intensity has been studied utilizing the high energy resolution of 0.13 eV (FWHM). A comparison of the RIXS profiles at $(π~0)$ and $(π~π)$ indicates that the continuum intensity exists even at $(π~π)$ in the overdoped samples, whereas it has been reported only at $(0 ~0)$ and $(π~0)$ for the $x=0.17$ sample. Furthermore, we also found an additional excitation on top of the continuum intensity at the $(π~π)$ and $(π~0)$ positions.

Source-reported materials — not catalogue approval

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